SL-110 Carrier Lifetime Measurement System

SL-110

NVIS TECHNOLOGIES

New

SL-110 Carrier Lifetime Measurement System is used to measure the minority carrier lifetime in a solar cell by using Open Circuit voltage Decay (OCVD) method and Reverse Recovery Transient (RRT) method. This is a unique system which consists of an inbuilt square wave generator (used for RRT method), a solar cell, LED (flash/light source), and an optional connectivity to PC (via USB).

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Category Solar Energy

- Built-in AC square wave generator required for RRT method.
- LCD (16x2) display for indications.
- USB connectivity to acquire values of V_oc in OCVD method to PC for analysis.
- BNC cables & connectors for noise free signal output.

- To measure the open circuit voltage decay of a crystalline silicon solar cell.
- To measure the reverse recovery transient of the solar cell.
- To calculate the lifetime of the solar cell by the two methods.
- To understand the concept of lifetime in solar cells.
- To understand the relation between open circuit voltage decay and lifetime in a solar cells.
- To understand the reverse current generated cell due to minority carriers and storage time of carriers in solar cells.
- Ability to measure and calculate the lifetime of carriers in solar cells.

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