VersaScan from PAR (Ametek)

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VersaSCAN Electrochemical Scanning System

The VersaSCAN is a single platform capable of providing spatial resolution to both electrochemical and materials-based measurements. Each VersaSCAN is based on a common high-resolution, long-travel, closed-loop positioning system mounted to a vibration-resistant optical base. Different auxiliary pieces are mounted to the positioning system. These ancillary pieces (e.g., an electrometer, piezo vibration unit, or a laser sensor) provide functionality to the positioning system for different scanning probe experiments. VersaSTAT potentiostats and Signal Recovery Lock-in Amplifiers are integrated via ethernet control to make accurate measurements of these small signals.

VersaSCAN SECM: Scanning Electrochemical Microscopy (SECM)
VersaSCAN SVET: Scanning Vibrating Electrode Technique (SVET)
VersaSCAN SKP: Scanning Kelvin Probe (SKP)
VersaSCAN LEIS: Localized Electrochemical Impedance Spectroscopy (LEIS)
VersaSCAN SDS: Scanning Droplet System (SDS)
VersaSCAN OSP: Non-Contact Surface Profiling (OSP)

Each technique uses a different measurement probe that is positioned close, but not in conact to the sample. After a measurement is made at the probe, its position is incremented. Plotting recorded parameter versus probe position creates a data map. Depending on the technique, this map could represent local electrochemical current, impedance, relative work function, or topography.

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VersaScan from PAR (Ametek)